9 results
Widening the Window of Particle Beam Technology: Helium Ion Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 802-803
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- July 2012
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He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1186-1187
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- August 2008
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Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1470-1471
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- August 2007
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Nano-tip Electron Gun for the Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 766-767
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- August 2005
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Variable Pressure/Environmental SEM a Powerful Tool for Nanotechnology and Nanomanufacturing
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 388-389
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- August 2005
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Electron Beam-Induced Sample Contamination in the SEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 764-765
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- August 2005
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Is Low Accelerating Voltage Always the Best for Semiconductor Inspection and Metrology?
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- Journal:
- Microscopy Today / Volume 12 / Issue 1 / January 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 46-47
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- January 2004
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Is Low Accelerating Voltage Always the Best for Semiconductor Inspection and Metrology?
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 978-979
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- August 2003
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New Scanning Electron Microscope Sharpness Standard: NIST Reference Material 8091 (Rm 8091)
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 494-495
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- August 2001
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